| SI.No | Title | Division | Facility/Equipment | Method/Instrument | Charges for R&D Instt & SSI | Charges for Students | Charges for Industry | Charges for Internal Samples | Remark | Remark2 |
|---|---|---|---|---|---|---|---|---|---|---|
| 1 | Thermomechanical Analyzer (Hitachi) | Materials Science and Technology | Thermomechanical Analyzer (Hitachi) | Thermomechanical Analyzer (Hitachi) | 2500 | 1250 | 5000 | Per sample |
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| 2 | Trace Element analysis AAS | Materials Science and Technology | Trace Element analysis AAS | 1890 | 1500 | 3780 | Per Hour |
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| 3 | Energy Dispersive X-ray Fluorescence | Materials Science and Technology | Energy Dispersive X-ray Fluorescence | Energy Dispersive X-ray Fluorescence | 1140 | 900 | 2280 | Per sample |
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| 4 | Surface area Analyzer Tristar 3000-BET | Materials Science and Technology | Surface area Analyzer Tristar 3000-BET | Surface area Analyzer Tristar 3000-BET | 4500 | 2250 | 9000 | Per sample |
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| 5 | Thermo gravimetric/Differential thermal analyzer- analysis Diamond TG/DTA Perkin Elmer | Materials Science and Technology | Thermo gravimetric/Differential thermal analyzer- analysis Diamond TG/DTA Perkin Elmer | Thermo gravimetric/Differential thermal analyzer- analysis Diamond TG/DTA Perkin Elmer | 4350 | 2180 | 8700 | Per sample |
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| 6 | Contact Angle Goniometer | Materials Science and Technology | Contact Angle Goniometer | Kurss DSA 30E | 450 | 250 | 865 | Per sample |
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| 7 | Polarised Optical Microscope (Leica DM2700P with digital camera and software) | Materials Science and Technology | Polarised Optical Microscope (Leica DM2700P with digital camera and software) | Polarised Optical Microscope (Leica DM2700P with digital camera and software) | 1200 | 600 | 2400 | Per sample |
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| 8 | Dielectric Spectroscopy (1 mHz to 32 MHz) Solartron 1260 | Materials Science and Technology | Dielectric Spectroscopy (1 mHz to 32 MHz) Solartron 1260 | Dielectric Spectroscopy (1 mHz to 32 MHz) Solartron 1261 | 1200 | 600 | 2400 | Per sample |
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| 9 | Optical Metallography (Leica DMRX microscope with digital camera and material work station) |
Materials Science and Technology | Optical Metallography (Leica DMRX microscope with digital camera and material work station) |
Optical Metallography (Leica DMRX microscope with digital camera and material work station) |
1200 | 600 | 2400 | Per sample |
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| 10 | Stereomicroscope (Zeiss microscope with digital camera) | Materials Science and Technology | Stereomicroscope (Zeiss microscope with digital camera) | Stereomicroscope (Zeiss microscope with digital camera) | 1200 | 600 | 2400 | Per sample |
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| 11 | Micro-hardness tesing(clemex,js 2000) | Materials Science and Technology | Micro-hardness tesing(clemex,js 2000) | Micro-hardness tesing(clemex,js 2000) | 1350 | 680 | 2700 | Per sample |
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| 12 | Mechanical Testing facilities Instron UTM; 10 ton static Universal testing Machine (Instron, UK,Model;1195-5500R) |
Materials Science and Technology | Mechanical Testing facilities Instron UTM; 10 ton static Universal testing Machine (Instron, UK,Model;1195-5500R) |
Mechanical Testing facilities Instron UTM; 10 ton static Universal testing Machine (Instron, UK,Model;1195-5500R) |
1800 | 1380 | 3600 | Per sample |
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| 13 | Brinell/Vickers Hardness Testing; Imported hardness tester INDENTEC,UK roughness, fatigue etc;10 to Dynamic testing machine Instron, UK |
Materials Science and Technology | Brinell/Vickers Hardness Testing; Imported hardness tester INDENTEC,UK roughness, fatigue etc;10 to Dynamic testing machine Instron, UK |
Brinell/Vickers Hardness Testing; Imported hardness tester INDENTEC,UK roughness, fatigue etc;10 to Dynamic testing machine Instron, UK |
10800 | 5400 | 21600 | Per sample |
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| 14 | Model 8801 Wear & friction monitor DUCOM Instruments Model TR20LE | Materials Science and Technology | Model 8801 Wear & friction monitor DUCOM Instruments Model TR20LE | Model 8801 Wear & friction monitor DUCOM Instruments Model TR20LE | 1200 | 600 | 2400 | Per sample |
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| 15 | Thermal Conductivity Testing(Xe-Flash Technique) | Materials Science and Technology | Thermal Conductivity Testing(Xe-Flash Technique) | Thermal Conductivity Testing(Xe-Flash Technique) | 3750 | 2400 | 7500 | Per sample |
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| 16 | Dilatometry (Thermal Expansivity) | Materials Science and Technology | Dilatometry (Thermal Expansivity) | Dilatometry (Thermal Expansivity) | 2250 | 1500 | 4500 | Per sample |
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| 17 | Rheometer | Materials Science and Technology | Rheometer | 2040 | 1360 | 4080 | Per programme |
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| 18 | Differential Scanning Calorimetry (DSC) | Materials Science and Technology | Differential Scanning Calorimetry (DSC) | 3240 | 2000 | 6480 | Per sample |
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| 19 | Thermogravimetric Analyzer (TGA) | Materials Science and Technology | Thermogravimetric Analyzer (TGA) | 1500 | 1000 | 3000 | Per sample |
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| 20 | Zeta Potential Analyser | Materials Science and Technology | Zeta Potential Analyser | 480 | 320 | 960 | Per sample |
Analytical Testing & Services Coordinator's Address
Mr. Chandrakanth CK,
Sr.Principal Scientist,
Analytical Testing and Services Coordinator,
CSIR-NIIST, pappanamcode, Thiruvananthapuram - 695019,
Telephone. : +91-471-2515226 E-Mail: chandra[at]niist[dot]res[dot]in )
